SIC EPI

CRESTA EPI 200

CRESTA EPI 200

SIC EPI

This product is a vertical hot-wall CVD epitaxial system designed specifically for 6/8-inch silicon carbide power devices and compound semiconductors. Featuring vertical gas injection and a high-speed rotating susceptor, the system delivers excellent film thickness and doping uniformity, a high growth rate, and low defect density. It mainly consists of a vertical hot-wall reaction chamber, a high-vacuum transfer system, a laminar-flow gas distribution system, a high-temperature exhaust gas treatment system, and a high-precision temperature control system. It is an ideal mass-production platform for preparing epitaxial layers for SiC high-voltage devices.
Wafer Size
6-inch / 8-inch (compatible)
Applicable Materials
Silicon Carbide (4H-SiC)
Applicable Processes
SiC homoepitaxial growth (N-type/P-type doping), high-speed thick-film epitaxy, multi-step buffer layer structure epitaxy

系统概述

This product is a vertical hot-wall CVD epitaxial system designed specifically for 6/8-inch silicon carbide power devices and compound semiconductors. Featuring vertical gas injection and a high-speed rotating susceptor, the system delivers excellent film thickness and doping uniformity, a high growth rate, and low defect density. It mainly consists of a vertical hot-wall reaction chamber, a high-vacuum transfer system, a laminar-flow gas distribution system, a high-temperature exhaust gas treatment system, and a high-precision temperature control system. It is an ideal mass-production platform for preparing epitaxial layers for SiC high-voltage devices.

产品特色

  • 卓越的均匀性与缺陷控制:垂直层流进气结合高速旋转托盘,确保晶圆表面流场与温场均匀,膜厚均匀性≤1.5%,掺杂浓度均匀性≤1.5%,并能有效抑制三角形缺陷、掉落物等致命缺陷。
  • 高产能设计:支持多片6/8英寸晶圆同步外延,反应腔体经流场与温场优化,可实现50μm/h以上的高生长速率,满足SBD、MOSFET厚膜外延的大批量生产需求。
  • 原位刻蚀与多工艺组合:集成原位HCl/H₂清洗与腔体刻蚀功能,可大幅减少颗粒物,延长设备维护周期,支持缓冲层/漂移层的不间断连续生长。
  • 维护便捷性高:采用开合式炉体与模块化基座设计,反应腔内件及石墨热场部件可快速更换,显著缩短PM与复机时间,降低长期使用成本。
  • 高精度温度控制:配备多区加热与多波长光学测温系统,实时精确控制并调节外延生长温度,确保高纯半绝缘及n/p型掺杂工艺的精确重复性

Product Features

Excellent Uniformity and Defect Control

Vertical laminar-flow gas injection combined with a high-speed rotating susceptor ensures uniform flow and thermal fields across the wafer surface. Film thickness uniformity is ≤1.5%, and doping concentration uniformity is ≤1.5%. It also effectively suppresses fatal defects such as triangular defects and fall-on particles.

High-Throughput Design

Supports simultaneous epitaxy of multiple 6/8-inch wafers. With optimized flow and thermal fields in the reaction chamber, it achieves a high growth rate of over 50 μm/h, meeting the mass-production requirements for thick-film epitaxy of SBDs and MOSFETs.

In-situ Etching and Multi-Process Integration

Integrated in-situ HCl/H₂ cleaning and chamber etching functions significantly reduce particles, extend equipment maintenance cycles, and support uninterrupted continuous growth of buffer/drift layers.

High Maintainability

The open-close furnace body and modular susceptor design allow rapid replacement of reactor internals and graphite thermal field components, significantly shortening PM and equipment restart time and reducing long-term cost of ownership.

High-Precision Temperature Control

Equipped with multi-zone heating and a multi-wavelength optical pyrometry system, it enables real-time precise control and adjustment of the epitaxial growth temperature, ensuring precise repeatability of high-purity semi-insulating and n/p-type doping processes.

Applicable Fields

化合物半导体功率器件(SiC MOSFET/SBD等)
Compound Semiconductor Power Devices (SiC MOSFET/SBD, etc.)
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